SN74BCT8373ADWR

IC SCAN TEST DEVICE LATCH 24SOIC
SN74BCT8373ADWR P1
SN74BCT8373ADWR P1
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Texas Instruments ~ SN74BCT8373ADWR

Part Number
SN74BCT8373ADWR
Manufacturer
Texas Instruments
Description
IC SCAN TEST DEVICE LATCH 24SOIC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data sheet
- SN74BCT8373ADWR PDF online browsing
Family
Logic - Specialty Logic
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Product Parameter

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Part Number SN74BCT8373ADWR
Part Status Obsolete
Logic Type Scan Test Device with D-Type Latches
Supply Voltage 4.5 V ~ 5.5 V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295", 7.50mm Width)
Supplier Device Package 24-SOIC

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